가공하지 않은 합성쿼츠 덩어리
반도체 Etching 공정에 들어가는
합성쿼츠 재질의 Focus Ring
반도체 노광 공정에서 ArF(193nm) 광원을 사용하는 포토마스크의 기판 소재로, 미세 회로 패턴 형성에 사용
Technical Information
Product
Applications
Optical Properties
Item | STI |
Total Transmission | > 90% (200–1500nm) |
OH Content | <1 ppm |
Fluorescence | None detected (254nm) |
Birefringence | < 1.971nm/cm |
Bubbles/Inclusions | 0 |

Thermal Properties
Item | Value |
Strain Point | 1060° C |
Annealing Point | 1120° C |
Softening Point | 1600° C |
Thermal Expansion (30–150°C) | 0.56 ppm/K |
Density | 2.2 |
Mechanical Properties
Property | Value |
Elastic Modulus (GPa) | 72 |
Poisson’s Ratio | 0.154 |
Density (g/cm³) | 2.2 |
Knoop Hardness (200g) | ≥ 650 |
Bending Strength | 50MPa |
• < 1 ppm moisture level – ideal for ArF/KrF lithography &
high-temperature plasma processes
• Over 90% transmittance across UV to IR range
• Excellent chemical stability with minimal metallic contamination
• Removes Internal bubble, uniformity
• Enhances optical clarity
• Relieves residual stress improves durability
• All processes integrated in-house for stable quality-control
• Proven long lifecycle in semiconductor tools (e.g., Focus Ring, Edge Ring)
Purity Analysis Values
Component | Metal Impurity (ppm) | Component | Metal Impurity (ppm) |
Aluminum (Al) | 0.0557 ( < 0.1 ) | Lead (Pb) | 0.0001 ( < 0.1 ) |
Antimony (Sb) | 0.0001 ( < 0.1 ) | Lithium (Li) | 0.0000 ( < 0.1 ) |
Arsenic (As) | 0.0001 ( < 0.1 ) | Magnesium (Mg) | 0.0060 ( < 0.1 ) |
Barium (Ba) | 0.0004 ( < 0.1 ) | Manganese (Mn) | 0.0002 ( < 0.1 ) |
Beryllium (Be) | 0.0001 ( < 0.1 ) | Molybdenum (Mo) | 0.0001 ( < 0.1 ) |
Bismuth (Bi) | 0.0002 ( < 0.1 ) | Nickel (Ni) | 0.0009 ( < 0.1 ) |
Boron (B ) | 0.0016 ( < 0.1 ) | Potassium (K ) | 0.0379 ( < 0.1 ) |
Cadmium (Cd) | 0.0001 ( < 0.1 ) | Sodium (Na) | 0.0367 ( < 0.1 ) |
Calcium (Ca) | 0.0509 ( < 0.1 ) | Strontium (Sr) | 0.0002 ( < 0.1 ) |
Chromium (Cr) | 0.0005 ( < 0.1 ) | Tin (Sn) | 0.0005 ( < 0.1 ) |
Cobalt (Co) | 0.0004 ( < 0.1 ) | Titanium (Ti) | 0.0004 ( < 0.1 ) |
Copper (Cu) | 0.0191( < 0.1 ) | Tungsten (W ) | 0.0002 ( < 0.1 ) |
Gallium (Ga) | 0.0001 ( < 0.1 ) | Vanadium (V ) | 0.0001 ( < 0.1 ) |
Germanium (Ge) | 0.0001 ( < 0.1 ) | Zinc (Zn) | 0.0409 ( < 0.1 ) |
Iron (Fe) | 0.0071 ( < 0.1 ) | Zirconium (Zr) | 0.0001 ( < 0.1 ) |
Total metal purity | < 1 ppm | ||
Optic Properties
Fluorescence Lamp Irradiation
UV Lamp Irradiation
SEM Surface Analysis
Model (Sasung Electronics test sample) | Inside & Outside Bubble Analysis values (ea) |
STI Synthetic Quartz Focus ring | Zero (0) |
Transmittance and
OH Content Data
STI Synthetic Quartz | Metallic Impurities [ppb] | OH Content [ppm] | Total Transmittance ( %) |
STI-V Grade | < 1000 | < 1 | > 89% (200 nm ~ 2200 nm) |
STI-C Grade | < 1000 | 300 ~ 500 | > 89% (200 nm ~ 2600 nm) |
Corning 7980 Grade | < 1000 | 800 ~ 1000 | > 89% (200 nm ~ 1350 nm) |
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